![To ja jestem rozwiązaniem – ZEISS Academy Metrology]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.100.33.0,282,1917,921.file/zeiss-academy-metrology-header.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.360.120.0,282,1917,921.file/zeiss-academy-metrology-header.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.768.256.0,282,1917,921.file/zeiss-academy-metrology-header.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.1024.341.0,282,1917,921.file/zeiss-academy-metrology-header.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.1280.427.0,282,1917,921.file/zeiss-academy-metrology-header.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.1440.480.0,282,1917,921.file/zeiss-academy-metrology-header.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-header.jpg/_jcr_content/renditions/original.image_file.1917.639.0,282,1917,921.file/zeiss-academy-metrology-header.jpg"} "To ja jestem rozwiązaniem – ZEISS Academy Metrology")
ZEISS Academy Metrology
To ty jesteś kluczem do rozwiązania|
Terminy
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Pobierz
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AUKOM Poziom 1 |
23-27 marca 2026 |
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AUKOM Poziom 2 |
4-8 maja 2026 |
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AUKOM Poziom 3 |
7-11 grudnia 2026 |
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AUKOM GD&T |
11-14 maja 2026 |
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Pakiet AUKOM * |
AUKOM 1 + AUKOM GD&T |
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CALYPSO Poziom 1 Podstawowe |
9-13 marca 2026 |
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CALYPSO Poziom 2 Zaawansowane |
13-17 kwietnia 2026 |
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CALYPSO Poziom 3 Expert |
28 września - 2 października 2026 |
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CALYPSO Curve |
21-23 września 2026 |
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ZEISS Inspect Optical 3D |
8-10 września 2026 |
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ZEISS Inspect GD&T |
21-22 kwietnia 2026 |
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* Przygotowaliśmy na Państwa prośbę pakiet cenowy AUKOM, który składa się ze szkoleń: AUKOM 1 oraz AUKOM GD&T. Na pakiet otrzymają Państwo specjalną cenę. Zakupione w pakiecie szkolenia należy zrealizować w ciągu 12 miesięcy od daty zamówienia.
Zgłoszenie pisemne należy przesłać w postaci elektronicznej na adres: pomiary.pl@zeiss.com
Dodatkowe informacje pod numerem tel. 22 205 55 24
Pobierz kalendarz szkoleń ZEISS 2026
![Podgląd pliku Kalendarz szkoleń 2026]({"max":"/content/dam/iqs/poland/pdfs/zeiss_iqs_calendar26_841x594_print_pl.pdf/_jcr_content/renditions/cq5dam.thumbnail.319.319.png"} "Pobierz Kalendarz szkoleń 2026")
Niezależnie od tego, czy dopiero zaczynasz swoją przygodę z techniką pomiarową, czy chcesz pogłębić swoją wiedzę, ZEISS ACADEMY METROLOGY jest tutaj, aby Cię wspierać. Nasze kompleksowe programy szkoleniowe mają na celu wypełnienie luk w umiejętnościach i skuteczne podnoszenie kwalifikacji pracowników. Bądź na bieżąco, ucząc się od najlepszych. Rozpocznij swoją podróż już dziś!
- Ponad 60 lokalizacji na całym świecie
- Ponad 500 certyfikowanych trenerów
- Ponad 35 lat doświadczenia
Co oferujemy
![]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.100.75.400,0,3600,2400.file/training_overview.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.360.270.400,0,3600,2400.file/training_overview.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.768.576.400,0,3600,2400.file/training_overview.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.1024.768.400,0,3600,2400.file/training_overview.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.1280.960.400,0,3600,2400.file/training_overview.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.1440.1080.400,0,3600,2400.file/training_overview.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_overview.jpg/_jcr_content/renditions/original.image_file.1920.1440.400,0,3600,2400.file/training_overview.jpg"})
![]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.100.75.232,0,4008,2832.file/training_formats.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.360.270.232,0,4008,2832.file/training_formats.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.768.576.232,0,4008,2832.file/training_formats.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.1024.768.232,0,4008,2832.file/training_formats.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.1280.960.232,0,4008,2832.file/training_formats.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.1440.1080.232,0,4008,2832.file/training_formats.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/training_formats.jpg/_jcr_content/renditions/original.image_file.1920.1440.232,0,4008,2832.file/training_formats.jpg"})
![]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.100.75.file/on_demand.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.360.270.file/on_demand.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.768.576.file/on_demand.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1024.768.file/on_demand.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1280.960.file/on_demand.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1440.1080.file/on_demand.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1920.1440.file/on_demand.jpg"})
Szukasz innego szkolenia?
Dostosuj szkolenie do swoich potrzebPowiedz nam o swoich celach, a my opracujemy odpowiednie rozwiązanie szkoleniowe, które pozwoli Ci je osiągnąć.
![]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.100.100.3509,1154,8145,5790.file/why_academy.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.360.360.3509,1154,8145,5790.file/why_academy.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.768.768.3509,1154,8145,5790.file/why_academy.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.1024.1024.3509,1154,8145,5790.file/why_academy.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.1280.1280.3509,1154,8145,5790.file/why_academy.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.1440.1440.3509,1154,8145,5790.file/why_academy.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/why_academy.jpg/_jcr_content/renditions/original.image_file.1920.1920.3509,1154,8145,5790.file/why_academy.jpg"})
Dlaczego właśnie ZEISS Academy Metrology?
Korzyści dla zespołu i firmySama technika pomiarowa nie poprawi jakości - zrobią to ludzie efektywnie z niej korzystający. Właśnie dlatego inwestowanie w zespół ma kluczowe znaczenie. Szkolenia z ZEISS Academy Metrology zwiększają produktywność poprzez rozwój umiejętności, promują ciągłe uczenie się w celu uzyskania przewagi konkurencyjnej i ustanawiają wysoki standard wiedzy specjalistycznej w firmie, aby zapewnić najlepszy zwrot z inwestycji w technikę pomiarową.
![Podgląd pliku GPS Poster 2023, EN]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/d9c9282d-2417-45fb-8c2c-0b5d1665a8ae/Poster_GPS_EN.pdf.jpg"} "Pobierz GPS Poster 2023, EN")
![Podgląd pliku Learning path CALIGO]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/9898d619-aeba-4187-8b28-08247fb0d57c/LP_CALIGO.pdf.jpg"} "Pobierz Learning path CALIGO")
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![Podgląd pliku Learning path X-ray]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/089119b7-dda2-441d-8911-88f257f42748/LP_XRAY.pdf.jpg"} "Pobierz Learning path X-ray")
![Podgląd pliku Poster ASME 2026]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/1962eff7-af18-4029-ab0b-89508663c6cb/Poster_ASME_EN.pdf.jpg"} "Pobierz Poster ASME 2026")
![Podgląd pliku ZEISS ACADEMY METROLOGY Training Guide Digital EN]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/3726feff-cb78-4f37-9894-33384ea17f78/ZEISS_Training_Brochure_EN_lowres_465191_0.pdf.jpg"} "Pobierz ZEISS ACADEMY METROLOGY Training Guide Digital EN")